978-0-8247-2567-9
Tribology In Chemical-Mechanical Planarization
Hong Liang and David Craven
Editorial: CRC Press Fecha de publicación: 01/03/2005 Páginas: 200Formato: Hardback 235 x 156 mm
Illustrating their intersecting role in manufacturing and technological development, this book examines tribological principles and their applications in CMP, including integrated circuits, basic concepts in surfaces of contacts, and common defects as well as friction, lubrication fundamentals, and the basics of wear. The book concludes its focus with mechanical aspects of CMP, pad materials, elastic modulus, and cell buckling. As the first source to integrate CMP and tribology, Tribology in Chemical-Mechanical Planarization provides applied scientists and engineers in the fields of semiconductors and microelectronics with clear foresight to the future of this technology.
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Materials Science
Tribology
Microelectronics
Reference
Professional